The "FPSM method" uses a Rietveld like fitting procedure to test all possible crystal structures from a Database, rank them and find the more probable in your diffraction pattern. In the end a Rietveld phase quantification is done with the phases identified. Be aware that if a phase is not present in the database (COD is used here), it cannot be found nor quantify; so this method is limited to only the phases for which a crystal structure has been determine and has been uploaded to the COD database. This page has been constructed to permit other people to use the method and test it on their data. To use it you need to upload a datafile in proper format. Use a .prn or .txt, double column format with no title line, first column contains the 2theta coordinates (d space for TOF), the second column the intensity (corrected for incident intensity for TOF). You need also to specify some additional instrument characteristics (wavelength, geometry etc.). If the selected instrumental broadening function much the one of your instrument, then a reasonable analysis of crystallite sizes and microstrain is reported.See paper: L. Lutterotti, H. Pilliere, C. Fontugne, P. Boullay, D. Chateigner (2014), submitted to J. Appl. Cryst.